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FIGURE 38.2
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Vacuum versus pneumatic compression.
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In most cases, the probe plate actually carries a socket or receptacle into which a replaceable spring probe is inserted, simplifying service. The underside of the receptacle protrudes into the fixture box and carries a wire-wrap tail. Each of these receptacle tails must be wired to an individual system interface contact on the bottom of the fixture. Compression of the product onto the fixture spring probes may be accomplished with electric drives, pneumatic air cylinders, or vacuum (see Fig. 38.2). Vacuum compression can result in the lowest system cost, but adds cost to the fixture and limits the total number of probes that can be compressed. Many forms of fixture interfaces have been provided, with many appearing as small universal grid patterns. Some very simple test systems have been constructed with a large number of ribbon (or other) cable connectors presented as the only connection to the fixture. The matching wired fixture may be troublesome to connect (because of the large number of cables), but is left connected for days or weeks at a time to a single fixture type due to the quantities of boards being tested.
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Flying Probe Type Test Systems Smaller volumes and specialty parts are tested on flying probe type test systems. These consist of a small number of robotic probes with independent measurement abilities.These are moved among the various product test target locations, and a sequence of measurements is made. Such systems offer the powerful advantage that no fixture preparation is required (although data must still be processed to prepare the test program). The best of these systems are also able to provide extremely high probe placement accuracy, generally exceeding that of fixtured systems. The primary drawback of such systems is low throughput, as a result of the need to reposition the probes mechanically between measurements.
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The most flexible and widely used electrical test solution is the universal grid test system (see Fig. 38.3). Most systems now include upper and lower grids, permitting simultaneous dual-side access for test of surface-mount technology (SMT) type products. Grids offer very high test speeds, and moderate the cost of test fixtures by permitting the reuse of many fixture components.Thus, today, the majority of product is tested on universal grid systems and fixtures.
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Universal grid test system. (Courtesy of Everett Charles
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Universal Grid Test System Design The universal grid test system presents a rectangular array of equally spaced test points. Generally this is chosen to be large enough to cover the test area of the largest product type to be tested (see Fig. 38.4). It is common to speak of the density of test points presented.
FIGURE 38.4
Universal grid testable area.
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A single-density system presents points spaced at 0.100 in. (10 per in.).Thus, there are 100 points per sq. in. Similarly, a double-density system has test points spaced at 0.0707 in. and provides 200 points per sq. in., and quad-density spacing is 0.050 in. for a density of 400 points per sq. in. As grid cost is largely a function of the number of test points, larger sizes and/or higherdensity configurations become expensive. With modern grid designs, the test system grid size can be upgraded in the field by addition of electronic modules. With older designs that use wire between the grid and the electronics, upgrades may be less practical. 38.3.2 Exclusion Mask Fixtures for Universal Grid Systems Occasionally, some applications involve product whose test-point spacing exactly matches the grid pattern. This situation may permit use of a very simple fixture referred to as an exclusion mask.This is composed of a thin glass-epoxy sheet, perhaps 0.030 in. thick, drilled at those locations where test probes are desired to pass through from the grid to make contact with the product. The exclusion mask (see Fig. 38.5) prevents unused grid probes from contacting the product unnecessarily, preventing erratic contacts and marking of the product. To use such a mask, it is necessary that the grid be constructed with a pointed or chisel-tip probe. Unfortunately, few products exist that are so simple to test.
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