barcode scanner code in asp.net FINE-PITCH TILT-PIN FIXTURES in Software

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FINE-PITCH TILT-PIN FIXTURES
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Many HDI structures can be tested with advanced examples of tilt-pin fixtures. Using such techniques as test pins that taper (see Fig. 39.1) to a very fine diameter at one end, fixtures have been built for devices with pitch down to about 0.010 in., with research and development (R&D) examples at about 0.008 in. These fixtures contain additional plates to support the very thin pins (so they do not buckle under pressure or short to adjacent pins). Those fixture plates very close to the product must be fairly thin, or the closely spaced holes will break out into one another. Such fixtures increase the demand for higher grid densities.These fixtures and pins are moderately more expensive to prepare than standard fixtures, but use similar technologies and processes. Excellent process control is important, as is excellent pin tip symmetry.
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FIGURE 39.1 Tapered pin for a fine-geometry fixture.
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Areas of the product requiring large numbers of probes are subjected to considerable total force. If no equal and opposing force is applied on the opposite side of the product, bowing or potato chipping of the product will occur. Ultimately this can collapse the opposing test fixture, but long before this, the probing accuracy of a fine-pitch fixture will be affected because the product no longer lies in a flat horizontal plane. To avoid this, the fixture software can add support within the opposing fixture, directly opposite the densely probed site. This additional support can be accomplished with a spacer affixed between the top and bottom fixture plates or by using blind pins. Blind pins are ordinary test pins located in the opposing fixture at sites where the top (product side) plate of the probing fixture is not quite drilled all the way through. If a quantity of blind pins equal to the quantity of dense product site probes is employed, then the opposing forces are perfectly balanced in this region. When dealing with fine-pitch fixtures, the problem of product and fixture registration must be considered. Even if the fixture is manufactured perfectly, the product may not align. Because the tooling features of the product (edge or tooling hole) are added in a process separate from the artwork production, the artwork and tooling features are usually misaligned.
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With HDI substrates, it doesn t take much for this error to move pads completely away from the assigned test pins. To overcome this, a variety of test systems are available with optical and/or electrical means of sensing misregistration. Movable plates in the fixture are controlled by servomotors, which reposition the product through motion of the tooling pins. As the product grows in size, or as the manufacturing process deteriorates, the registration errors may not be sufficiently constant over the product area to permit the use of motorized alignment. In this case, none of the probe-per-pad fixtured approaches may be effective.
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Bending beam fixtures are somewhat similar to tilt-pin fixtures, except that they use extremely thin test pins manufactured from a special alloy. As in the tapered pin fixture, a significant number of thin supports are required near the product, where the pin tends to be held fairly straight to avoid conflict with other nearby pins. These pins are not held rigid, but are expected to buckle under force. This buckling displaces the pin sideways. The buckled portion may be located at some distance from the product plane, where the probes can be more widely separated. Once the pin has buckled, the force applied to move through a substantial travel is constant. This is very different from the case for a spring probe, where the force increases at a constant rate determined by the spring constant. Bending beam fixtures provide good immunity to witness mark damage. The basic technique has been in use in specialty situations for many years. At the interface side, these pins may mate to spring probes instead contacting a rigid contact surface. In some commercial examples, the pin continues away from the product as a piece of wire routed to widely spaced contacts on the interface portion of the fixture. These in turn interface with traditional spring probes. Within the fixture, the probe wire is bonded in place at some distance from the product, defining the separation between the probe and wiring portions of its overall length. Such fixtures are quite expensive, and replacing damaged probes can be challenging. Thus, this technique is usually restricted to small areas and limited test-point counts.
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